Ultrafast Electrical Measurements of Isolated Silicon Nanowires and Nanocrystals

Bergren, Matthew R.; Kendrick, Chito E.; Neale, Nathan R.; Redwing, Joan M.; Collins, Reuben T.; Furtak, Thomas E.; and Beard, Matthew C. Ultrafast Electrical Measurements of Isolated Silicon Nanowires and Nanocrystals J. Phys. Chem. Lett., 5, 2050-2057 (2014). [DOI: 10.1021/jz500863a] [CASP]

Authors

Bergren, Matthew R.
Kendrick, Chito E.
Neale, Nathan R.
Redwing, Joan M.
Collins, Reuben T.
Furtak, Thomas E.
Beard, Matthew C.