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Strained Interface Defects in Silicon Nanocrystals

Journal: 
Advanced Functional Materials
Volume: 
22
Pages: 
3223-3232
Year Published: 
March, 2012
DOI: 
10.1002/adfm.201200572
Solely Supported by the EFRC: 
Not Solely supported by the EFRC
Non-Peer-Reviewed: 
No
Author: 
Lee, Benjamin G
Hiller, Daniel
Luo, Jun-Wei
Semonin, Octavi Escala
Beard, Matthew C
Zacharias, Margit
Stradins, Paul

EFRC: Center for Advanced Solar Photophysics