Strained Interface Defects in Silicon Nanocrystals

Lee, Benjamin G; Hiller, Daniel; Luo, Jun-Wei; Semonin, Octavi Escala; Beard, Matthew C; Zacharias, Margit; and Stradins, Paul Strained Interface Defects in Silicon Nanocrystals Advanced Functional Materials, 22, 3223-3232 (2012). [DOI: 10.1002/adfm.201200572] [CASP]

Authors

Lee, Benjamin G
Hiller, Daniel
Luo, Jun-Wei
Semonin, Octavi Escala
Beard, Matthew C
Zacharias, Margit
Stradins, Paul